
Param1 - Param2 Correlation for: Product

Product over Equipment Performance
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The displays are generated for entities such as plant, product, equipment type, machine, work cell, step, operation, and part. Each manufactured part within the system is represented as a 3D-approximated object carrying the essential information allowing generating the fundamental SPC charts:
- Yield and throughput histograms (with SPC-limit marks)
- Defect/Error distribution
- Pareto analysis
- Normal distribution for each measured parameter
- Parameter correlation vs. other parameter
- Product/machine trend over time within work cells
- Equipment /product trend over time within a work cell
- XR charts
- Lot defects histogram
- Surface defect distribution and defect counts
- Equipment utilization graph (relevant to a time interval)
- Last 20 manufactured unit’s status (along with measured parameters) table
- Alarm table showing last 30 parts that violated SPC rules (per product)
- Overlapped 2-hour/shift/day/week/month yield/SPC reports
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